RMMT21129

  • Model Name: SemVision G4
  • Wafer Size: 300
  • Serial Number: TBD
  • Date Available: 05/10/2024
  • Group: Electronic
  • Owner: Micron
  • Category: Semiconductor Fabrication
  • Family: Metrology Equipment
  • Type: Patterned Wafer Defect Inspection
  • Manufacturer: Applied Materials
  • Location: SINGAPORE